Structural properties of CoPt films patterned using ion irradiation
Identifieur interne : 000868 ( Main/Exploration ); précédent : 000867; suivant : 000869Structural properties of CoPt films patterned using ion irradiation
Auteurs : M. Abes [France] ; J. Venuat [France] ; D. Muller [France] ; A. Carvalho [France] ; G. Schmerber [France] ; E. Beaurepaire [France] ; A. Dinia [France] ; V. Pierron-Bohnes [France]Source :
- Catalysis today [ 0920-5861 ] ; 2006.
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Abstract
Patterned CoPt films were fabricated using a combination of e-beam lithography and He+ ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He+ ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.
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Venuat</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1><s2>67034 Strasbourg</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName></affiliation></author><author><name sortKey="Muller, D" sort="Muller, D" uniqKey="Muller D" first="D." last="Muller">D. 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Carvalho</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1><s2>67034 Strasbourg</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName></affiliation></author><author><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. 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Beaurepaire</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1><s2>67034 Strasbourg</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName></affiliation></author><author><name sortKey="Dinia, A" sort="Dinia, A" uniqKey="Dinia A" first="A." last="Dinia">A. Dinia</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1><s2>67034 Strasbourg</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName></affiliation></author><author><name sortKey="Pierron Bohnes, V" sort="Pierron Bohnes, V" uniqKey="Pierron Bohnes V" first="V." last="Pierron-Bohnes">V. Pierron-Bohnes</name><affiliation wicri:level="3"><inist:fA14 i1="01"><s1>IPCMS-GEMME (UMR 7504 CNRS), ULP-ECPM, 23 rue du Loess BP 43</s1><s2>67034 Strasbourg</s2><s3>FRA</s3><sZ>1 aut.</sZ><sZ>2 aut.</sZ><sZ>4 aut.</sZ><sZ>5 aut.</sZ><sZ>6 aut.</sZ><sZ>7 aut.</sZ><sZ>8 aut.</sZ></inist:fA14><country>France</country><placeName><region type="region" nuts="2">Grand Est</region><region type="old region" nuts="2">Alsace (région administrative)</region><settlement type="city">Strasbourg</settlement></placeName></affiliation></author></analytic><series><title level="j" type="main">Catalysis today</title><title level="j" type="abbreviated">Catal. today</title><idno type="ISSN">0920-5861</idno><imprint><date when="2006">2006</date></imprint></series></biblStruct></sourceDesc><seriesStmt><title level="j" type="main">Catalysis today</title><title level="j" type="abbreviated">Catal. today</title><idno type="ISSN">0920-5861</idno></seriesStmt></fileDesc><profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Cobalt</term><term>Electron beam lithography</term><term>Film</term><term>Heterogeneous catalysis</term><term>Ion irradiation</term><term>Magnetic properties</term><term>Patterning</term><term>Platinum</term><term>Roughness</term><term>Transition metal</term></keywords><keywords scheme="Pascal" xml:lang="fr"><term>Film</term><term>Irradiation ion</term><term>Rugosité</term><term>Propriété magnétique</term><term>Catalyse hétérogène</term><term>Formation motif</term><term>Cobalt</term><term>Platine</term><term>Métal transition</term><term>Lithographie faisceau électron</term></keywords><keywords scheme="Wicri" type="topic" xml:lang="fr"><term>Cobalt</term><term>Platine</term></keywords></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">Patterned CoPt films were fabricated using a combination of e-beam lithography and He<sup>+</sup> ion irradiation to produce a planar array of ordered CoPt squares separated by disordered CoPt areas: (i) by molecular beam epitaxy was deposited a CoPt ordered film which corresponds to a "natural" multilayer: alternating pure cobalt and pure platinum (0 0 1) planes. (ii) The film was covered by a 300 nm thick Pt layer mask. (iii) Irradiation with appropriate ion beam and fluence disorders the CoPt film where not protected by the mask. X-ray diffraction, as well as atomic and magnetic force microscopy, is used to characterise the structural and magnetic changes in the film. The He<sup>+</sup> ion irradiation does not significantly modify the surface of the CoPt film: the roughness almost remains identical (∼2 nm). This is promising for applications in magnetic recording technologies.</div></front></TEI><affiliations><list><country><li>France</li></country><region><li>Alsace (région administrative)</li><li>Grand Est</li></region><settlement><li>Strasbourg</li></settlement></list><tree><country name="France"><region name="Grand Est"><name sortKey="Abes, M" sort="Abes, M" uniqKey="Abes M" first="M." last="Abes">M. Abes</name></region><name sortKey="Beaurepaire, E" sort="Beaurepaire, E" uniqKey="Beaurepaire E" first="E." last="Beaurepaire">E. Beaurepaire</name><name sortKey="Carvalho, A" sort="Carvalho, A" uniqKey="Carvalho A" first="A." last="Carvalho">A. Carvalho</name><name sortKey="Dinia, A" sort="Dinia, A" uniqKey="Dinia A" first="A." last="Dinia">A. Dinia</name><name sortKey="Muller, D" sort="Muller, D" uniqKey="Muller D" first="D." last="Muller">D. Muller</name><name sortKey="Pierron Bohnes, V" sort="Pierron Bohnes, V" uniqKey="Pierron Bohnes V" first="V." last="Pierron-Bohnes">V. Pierron-Bohnes</name><name sortKey="Schmerber, G" sort="Schmerber, G" uniqKey="Schmerber G" first="G." last="Schmerber">G. Schmerber</name><name sortKey="Venuat, J" sort="Venuat, J" uniqKey="Venuat J" first="J." last="Venuat">J. Venuat</name></country></tree></affiliations></record>Pour manipuler ce document sous Unix (Dilib)
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